International Conference on Nuclear Data for Science and Technology 2010
J. Korean Phys. Soc. 59, 1617-1619
Paper ID: ND-1642
DOI: 10.3938/jkps.59.1617
PACS: 29.50.+v
Development of the Bunch Length Detector
Joon Yeon Kim1, Do Gyun Kim1, Hyoung Chan Bhang1, Chong Cheoul Yun2 and Jong Won Kim3
1 Department of Physics, Seoul National University, Gwanakro Sillim-dong, Gwanak-gu, Seoul, 151-747 Korea
2 Chung-Ang University, 221 Heuk Seok-dong, Dongjak-gu, Seoul, Korea
3 National Cancer Center, 323 Ilsan-ro, Ilsandaong-gu, Goyang-si Gyeonggi-do, 410-769, Korea
A bunch length detector is under construction to measure the time structure of a beam bunch based on the analysis of secondary electrons, which are produced by an ion beam hitting on a thin wire. The detector can measure the longitudinal beam shape possibly in a wide range of beam energy, intensity and ion species. A main component of the device is the rf deflector to deflect electrons in correlation with rf phase of the beam bunch. Its electromagnetic properties were analyzed using rf analysis programs, and a full-scale cold model was constructed and tested. A microchannel plate detector to measure electron currents was tested using a β-ray emitting source. With the tests of the components completed, the actual detector is being constructed based on the calculations of electron optics as well as from the test results.
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